AR-NW2A Time-resolved XAFS and X-ray Imaging

Techniques

XAFS(X-ray Absorption Fine Structure)

• Energy range: White X-ray or 5 – 24 keV
• Transmission mode: Ionization chamber

Time-resolved XAFS (DXAFS)

• Transmission mode with polychromator
• Photo diode array detector
• Si-microstrip detector (XSTRIP)

X-ray Imaging

• 2D Imaging XAFS system (spatial resolution: 10 μm)
• Absorption Contrast and Phase Contrast X-CT (spatial resolution and field of view: 30-60 nm, 20 -40 μm)
• XAFS-CT (spatial resolution and field of view: 30 – 60 nm, 20 -40 μm)

Other experimental with white or monochromatized X-ray

• Please contact us before experiment

Light source

PF-AR Insertion device ID#2

• Ring energy: 6.5 GeV
• Max. current: 60 mA (Not Top-up operation)
• Critical energy: 26.3 keV
• Horizontal acceptance: 1 mrad(H) / 0.2mrad(V)
• Tapered mode available

Beamline optics

Monochromator

• Si(111) Liquid N₂-cooled double crystal
• Energy range: 5 – 24 keV
• Numerical-drive (Kohzu system)

Focusing system

• Bent cylinder mirror (Rh coated)
• Bent flat mirror (Rh coated)
• Standard beam size: 0.6H x 0.2V mm

Performance

Focused and Monochromatized mode

• Energy range: 5 – 24 keV
• Energy resolution: ΔE/E～2×10^-4
• Photon flux at sample position: 6×10¹² phs/s (12 keV)

White X-ray mode

Experimantal station

Experimental hutch

• Hatch size: 3.0L x 3.8W x 3.0H m
• Door size: 2.6W x 2.4H m

Standard setup

• XAFS setup: Ionization chumber
• DXAFS setup: Polychromator, PDA detector
• 2D Imaging XAFS setup: XAFS stage, ORCA Flash 4.0
• X-CT: Xradia 800 Synchrotron (ZEISS)

Beamline manager

• 丹羽 尉博 NIWA Yasuhiro (KEK-PF)
  yasuhiro.niwa[@]kek.jp